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Building on manual operations, certain functions have been automated—such as the movement of the sample stage—significantly enhancing testing efficiency and making it ideal for medium-scale testing requirements.
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ABOUT US
Technology, tracing back to beauty
Company Incorporation
R&D Experience
Patent
Partner Clients
Shenzhen Cindbest Technology Co., Ltd. (Cindbest) is a comprehensive high-tech enterprise specializing in the research, development, manufacturing, and sales of probe station equipment, as well as integrating and distributing related laboratory equipment.
Quality Assurance
● Over 10 years of accumulated technology and more than 30 probe station-related patent certificates. ● We’ve collaborated with nearly 200 universities, over 40 research institutes, and more than 30 major companies in the semiconductor industry. ● We operate our own 500+ square meter machining workshop, ensuring precise manufacturing control and significantly reducing the time from R&D to delivery.
After-sales service
● To provide customers with comprehensive support services such as product consultation, solution construction, product customization, delivery acceptance, skill training, tracking and maintenance, making your after-sales experience more efficient and satisfactory.
Product cost-effectiveness
● Sindongbao focuses on the independent R&D of probe stations and offers customizable solutions. We specialize in the autonomous design of motion modules, optical systems, and temperature-controlled components, and we’re GGB probe and Leybold vacuum pump agents—providing customers with a one-stop service. ● We avoid excessive brand markups, relying instead on efficient production and delivery processes to deliver competitive pricing.
Business Development
● Certified with ISO9001 and CE certifications. ● In 2020, it was honored as a Guangdong Province Contract-Honoring and Trustworthy Enterprise. ● In 2023, the company was approved as a National High-Tech Enterprise. ● In 2024, it earned the title of Shenzhen Specialized, Sophisticated, and Novel Enterprise.
Product
Probe station
Multi-magnification Optical Display System
Compatible with 12”, 8”, 6”, and 4” wafer testing and dicing tests
Internal air suspension system effectively isolates external vibrations.
Integrated control system for rapid access to instrument testing
Software automation testing, precise calibration of mechanical accuracy
X-Y axis travel speed: 70 mm/sec, repeat positioning accuracy: ≤±1 μm
Z-axis travel speed: 20 mm/sec, Z-axis positioning repeatability: ≤ ±μm
R-axis accuracy: 0.0001°, repeat positioning accuracy: ≤±1 μm
CP 200/300 Semi-Automatic Probe Station
Multi-magnification optical display system
Temperature range: 8K–300K
Extreme vacuum better than 5 x 10⁻⁶ Torr
Supports 6 probe arms and DC measurements, with leakage current accuracy better than 100 fA.
Supports RF testing with a frequency range of DC to 110 GHz.
Supports optical testing, wavelength range: 190 nm to 2200 nm
Hall measurements and magnetotransport measurements
Magnet type: Superconducting magnet
CRX-SM Low-Temperature Superconducting Vacuum Probe Station
Compatible with DC testing, optoelectronic testing, RF testing, superconducting vertical magnetic field measurements, and low-temperature experiments, among others.
The CINDBEST CH model probe station is a fully functional, highly versatile probe station.
It can accommodate testing of various samples, especially large-sized ones, such as 8-inch wafers, 12-inch wafers, and more.
It can also accommodate testing for various applications, such as DC testing, RF testing, and more.
Testing IV curves, CV curves, LIV curves, RF testing, and high-voltage, high-current tests
Low-Dimensional Material Heterostructure Device Transfer System
M001 Compact Vacuum High- and Low-Temperature Probe Station
High-vacuum chamber with a temperature range of -196 to 200°C (300°C, 400°C, and 500°C available as custom options);
EMMI Photon Micro-Leakage Analysis Probe Station
The EMMI photon micro-leakage localization analysis system is a crucial tool in integrated circuit failure analysis, and leakage localization is an essential capability for failure analysts.
Probe Station Accessories
0.5µm optional travel accuracy
DC Test Probe Socket
RF Test Probe Socket
Linear motion
Four-dimensional adjustment
X-Y-Z travel range can reach up to 20mm
Magnetic adsorption and vacuum adsorption options available
0.5 / 0.7 / 2 / 10 µm optional travel accuracy mircopositioner
Leakage current accuracy below 100 fA
Leakage flow (tip diameter 20um): 10KV/3KV
Working temperature: -55℃~300℃
1.8m tri-axis dual-shielded cable, equipped with a three-axis male connector (adapters available to match customer testing instruments)
It is recommended to use a probe holder with CB-40-T grade or higher accuracy.
Leakage current accuracy below 100 fA
GGB DC-110GHZ RF Probe
Leakage current accuracy can reach 10 pA (when used with a shielding box).
Maximum current rating: 1A
High voltage: 700V
1.5M coaxial cable, coaxial male connector
It is recommended to use a probe holder with accuracy equal to or better than CB-40-T.
Electrical accuracy can reach up to 10 PA (when used with a shielding box).
0.5 / 0.7 / 2 / 10 µm optional travel accuracy
DC Test Probe Socket
RF Test Probe Socket
Linear motion
Four-dimensional adjustment
X-Y-Z travel range can reach up to 20mm
Magnetic adsorption and vacuum adsorption options available
0.5 / 0.7 / 2 / 10 µm optional travel accuracy
Solution
The core of the probe station's IV/CV DC testing lies in establishing electrical connections via probes, enabling precise measurements of a semiconductor device's current-voltage (IV) and capacitance-voltage (CV) characteristics when used in conjunction with test instruments—ultimately helping to evaluate the device's performance and reliability.
At the heart of probe station optoelectronic testing lies the establishment of a closed-loop "light-electricity" conversion and detection system. By precisely controlling illumination conditions and ensuring stable electrical probe contact, the system measures the electrical response of optoelectronic devices under light excitation, enabling an assessment of their photoelectric conversion efficiency and overall performance.
At the heart of probe station laser repair testing lies precise defect localization and targeted restoration. Specifically, the process leverages the probe station’s high-precision positioning system—combined with optical observation tools like microscopes—to accurately identify defect locations on semiconductor devices. Once the defects are pinpointed, a laser beam is used to perform repair operations, such as melting and removing unwanted connections, fixing short circuits, adjusting resistance values, or depositing materials—ultimately restoring the device to its intended functionality.
The probe station Hall effect testing solution is a core technology for characterizing the electrical properties of semiconductor materials and devices. By integrating precision mechanical manipulation, stable magnetic field generation, accurate environmental control, and intelligent signal analysis, it enables non-destructive, high-precision measurements of critical parameters such as carrier concentration, mobility, and conductivity type.
At the heart of the probe station RF testing solution lies the ability to achieve precise RF signal transmission, distortion-free measurements, and system-level error calibration—all at the wafer level. By integrating advanced precision mechanics, high-frequency signal pathways, and intelligent calibration technologies, this solution effectively addresses critical challenges at high frequencies, such as skin effect, impedance mismatch, and parasitic interference. Ultimately, it enables the accurate extraction of key RF characteristics for the Device Under Test (DUT), including S-parameters, power levels, and phase information.
Silicon photonics testing, high-power device testing, high- and low-temperature vacuum testing, as well as high-voltage, high-current testing, and more.
Service
The quality policy is formulated based on the fundamental principles of quality management and serves as our company’s overarching quality mission and direction.
We offer a 7-day no-quibble return and exchange policy, with professional customer service available 24/7 to answer your questions, and dedicated after-sales specialists who will promptly follow up on repairs—ensuring your shopping rights are fully protected.
Shenzhen Cindbest Technology Co., Ltd. (Cindbest) is a comprehensive high-tech enterprise specializing in the R&D, manufacturing, and sales of probe station equipment, as well as integrating and distributing related laboratory equipment.
Shenzhen Cindbest Technology Co., Ltd. (Cindbest) is a comprehensive high-tech enterprise specializing in the R&D, manufacturing, and sales of probe station equipment, as well as integrating and distributing related laboratory equipment.
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Service
Universities and research institutes
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