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CM-4 Simple Probe Station
The CM series probe stations feature a compact design, deliver high measurement accuracy, offer convenient operation, and are ergonomically designed for user comfort.
Primarily used for I-V/C-V PIV testing, as well as in testing within the semiconductor and optoelectronics industries.
Widely used in the research and development of precision electrical measurements for complex, high-speed devices.
CM Series Simple Probe Station
- Description
- Parameters
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Uses
- Primarily used for I-V/C-V PIV testing, as well as testing in the semiconductor and optoelectronics industries.
- Widely used in the R&D of precision electrical measurements for complex, high-speed devices
Ergonomics and Optional Features
- Adjustable needle holder platform allows for quick lifting and lowering, enabling rapid separation of samples and probes.
- Chuck rotates and locks in place
- The needle holder platform accommodates DC/RF positioners.
- Offering a variety of configurations, including multiple chuck options, micro-positioners, microscopes, cameras, PCB holders, and more.
- Optional instrument racks, vibration isolation tables, dark boxes, and more
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Technical specifications
Model CM-4
Truncated pyramid
Chuck size
4 inches
Sample stage rotation
Rotates 360 degrees, with fine adjustment capability of 15 degrees and precision down to 0.1 degree—equipped with an angle-lock mechanism.
Sample Fixing Method
Vacuum adsorption, central suction port, multi-ring adsorption ring
X-Y Travel Distance
2 inches x 3 inches
X-Y Motion Accuracy
10um
Needle holder platform
One needle holder platform on each side, capable of holding up to 6 small probe holders.
Back Electrode Testing
The sample stage is electrically isolated and suspended, with a 4mm jack available for connecting the back electrode (optional).
Microscope
Microscope Mounting Method
Pillar-rotating type
Microscope Types
Single-lens microscope
Stereo Microscope
Magnification power
0.75x-5x zoom
16X-100X
Light source
Coaxial light source
External LED Ring Light
CCD
2-megapixel (upgradeable to 20-megapixels)
Probe holder
X-Y-Z Travel Distance
12mm x 12mm x 12mm / 20mm x 20mm x 20mm
Mobile precision
10um/2um/0.7um/0.5um
Adsorption method
Magnetic adsorption / Vacuum adsorption
Probe Fixture
Cables
Coaxial cable / Triaxial cable / RF cable
Leakage current accuracy
10pA/100fA/10fA
Fixed probe
Spring fixation / Tubular fixation / Claw-type fixation
Connector Type
BNC / Three-axis / Banana Plug / Alligator Clip / Terminal Block / RF Connector
Probe
DC needle tip diameter
lum/2um/5um/10um/20um/50um/100um
RF probe frequency
40GHz/50GHz/67GHz/110GHz
Material
Tungsten steel / Beryllium copper / Nickel-plated
External dimensions
400W x 370D x 490H
Weight
Approximately 18 kilograms
Optional accessories
Heating stage
Gold-plated chuck
Seismic-resistant desk
Shielding box
Customized according to customer requirements