M001 Compact Vacuum High- and Low-Temperature Probe Station

• Temperature range: -196°C to 500°C (upgradable to higher temperature) • Temperature change rate: 0~10°C/min, linearly controllable heating and cooling • Temperature resolution and stability: ±0.1°C • High-precision temperature controller and programmable temperature control software • Control method: PID closed-loop control • Temperature sensor: PT100, 1 unit • Cooling method: Liquid nitrogen (pump-controlled), includes 2L liquid nitrogen tank • Number and material of probes: 4 (gold-plated copper) • Sample stage material and size: Nickel-plated copper, 35*35mm (subject to actual size) • Cold/hot stage dimensions: 160*150mm (subject to actual size) • Optical observation window: φ25mm (subject to actual size) • Vacuum compatible, supports protective gas (nitrogen), with water-cooling interface • Basic configuration: M002 cold/hot stage x1, high/low temperature controller x1, temperature control software x1 • Optional: Computer, installation stand, source meter, coaxial BNC, vacuum system, humidity control system, custom control software

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M001 Compact probe station

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Description
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Describe
●A high-vacuum chamber with a temperature range of -196~200℃ (300℃, 400℃, 500℃);
●Provides effective cryogenic operation, using liquid nitrogen or liquid helium to achieve continuous cooling of the system;
●Upgrades are available in terms of micropositioner, temperature range, vacuum range, and optical access.
●Affordable – highly competitive prices compared to other products in the same category;
●The compact desktop design is the best choice for academic and experimental research;
● This product is designed for testing the electrical properties of research samples under varying temperatures, and can characterize the changes in the electrical properties of samples with temperature.
Application
●The M001 chip temperature-controlled testing instrument is mainly used for IV/CV/PIV testing, and is also used in the semiconductor and optoelectronic industries.
●Widely used in the research and development of precision electrical measurements for complex, high-speed devices.
Main features
●Compact structure, suitable for various temperature variations.
● ●Temperature range: -196~200℃ (300℃, 400℃, 500℃)
●The airtight chamber design allows for the passage of protective gas.
●Supports modification or customization of multi-probe testing

vPlatform configuration parameters

model	M001
cavity size	≥6-inch high vacuum chamber
Observation window	High-transparency quartz observation window with a diameter of φ≥41mm
Sample stage size	≥35×35mm
Sample stage material	Nickel-plated copper
External dimensions	600x500x112mm, including probe adjustment stage (for reference only, actual size may vary).
Sample chamber height	21mm
probe arm interface	Standard configuration includes 4 probe arms (including probe clamps), XZ stroke ±6mm (fine adjustment), Y stroke 50mm (coarse adjustment) + ±6mm (fine adjustment).
probe movement accuracy	2μm
Ultimate vacuum of the cavity	≤10⁻³ Torr, Triaxial High Vacuum Interface
Maximum measurable voltage	≥1500V
Maximum measurable current	≥10A, leakage current accuracy ≤100fA@25℃
Demension and weight	600500112MM 20KG

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M001

19874522745

miles@cindbest.com

Unit A, 1st Floor, Building 2, Jiayiyuan Digital Science Park, Xinshi Community, Dalang Subdistrict, Longhua District, Shenzhen City

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M001 Compact Vacuum High- and Low-Temperature Probe Station

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