CRX-4.5K Semiconductor Device Testing Probe Station
●Using a closed-loop refrigeration mechanism for cooling: 4K base temperature, temperature range: 4.5K to 350K
●Sample table size: 2 inches
●The sample stage is electrically independent and suspended, leading out a tri-coaxial interface
●Heater: Sample stage heater 50W, shielded chamber heater 100W
●Anti infrared radiation window
●Four temperature sensors are installed on the sample stage, shielding chamber, cold head, and probe arm respectively
●6 probe arm interfaces (compatible with DC arm, fiber arm, RF arm)
●The RF arm can support a frequency range of DC~110GHz
●DC arm leakage accuracy is better than 100fA
●The ultimate vacuum is better than 10-5Pa
● Integrated shock absorber bracket
● Size: 872 * 962 * 1400
● Weight: 130KG
Features
●  2 inch sample stage
●  Temperature range: 8K-300K
●  Vertical superconducting magnetic field
●  Vertical magnetic field strength in the whole temperature range: ±3T
●  6 probe arm interfaces
●  Allow unsupervised cooling
●  Cycleelectricity Refrigeration, no refrigerant required
●  One-button cooling, one-button temperature recovery, automatic temperature control, automatic field control
● Automatic test function

Description
● The CRX-SM low-temperature superconducting probe station adds a ±3T vertical superconducting magnet to the closed-loop probe station.
● Application areas include: IV / CV / microwave / photoelectric experimental test / superconducting vertical magnetic field measurement / low temperature test;
●It allows researchers to perform Hall measurements and magnetotransport measurements;
● Allow unsupervised cooling: cooling can be performed without the need for users to monitor all the time;
● The vibration amplitude of the sample holder is controlled within ≤1um;
● 6 probe arm interfaces are compatible with DC arm, RF arm, and fiber optic arm;
● At room temperature,the ultimate vacuum is <7×10^-4 (Torr); at low temperature, the ultimate vacuum is <7×10^-6 (Torr);Temperature control stability: better than ±10mK

--Key technical parameters

vProbe Arm Module(Probe arm + probe fixture + probe)

Probe Arm

DC arm CB-80-N

Fiber Optic Arm CB-80-F

RF Arm CB-80-RF

DC arm	Suitable for DC probes
RF Arm	Suitable for installing radio frequency probes (with R-axis rotation function to help the radio frequency probes to level quickly)
Fiber Optic Arm	Suitable for loading optical fiber into the cavity to irradiate the sample
Probe arm X-Y-Z travel range	25mm-70mm-15mm
R axis rotation angle	360 degree coarse adjustment, fine adjustment±7.5 (RF arm only)
Movement accuracy	±2um

Probe fixture

	Ceramic probe fixture	RF Probe Fixture	Fiber Optic Clamp
Maximum voltage	200V	50V	Fiber Fixing Clamp
Maximum current	1A	2A
Leakage Current	100fA	100fA
Connectors	SMA	2.92/2.4/1.85/1.0mm
Matching probe type	Low temperature ceramic probe	40/50/60/110GHz probes
Probe tip material	Tungsten/Beryllium Copper	Beryllium copper/nickel plated/tungsten
Probe tip radius	0.5–20um	20um
Application	DC test	High frequency testing
Ceramic probe
design	Heat sink design
Material	Tungsten / Beryllium Copper
Tip radius	5um / 10um / 25um
magnetic	Non-magnetic / Magnetic

RF Probes - Selection Guide

RF probe

	40A	50A	67A
frequency	DC-40GHz	DC-50GHz	DC-67GHz
Connectors	2.92mm	2.4mm	1.85mm
Pin structure	GS/SG/GSG	GS/SG/GSG	GS/SG/GSG
Spacing range	25µ - 2540µ	25µ - 1250µ	25µ - 1250µ
Insertion loss	<.8db	<1.0db	<1.1db
Return loss	> 18db	>18db	>14db

19874522745

miles@cindbest.com

Unit A, 1st Floor, Building 2, Jiayiyuan Digital Science Park, Xinshi Community, Dalang Subdistrict, Longhua District, Shenzhen City

Business license

Temperature range	8K~300K
Sample stage size	2 inches
Sample stage vibration amplitude	≤1um
Sample stage type	Grounded sample stage (upgradeable to coaxial sample stage, triaxial sample stage)
Magnet Type	Superconducting magnets
Magnetic field direction	vertical
Magnetic field control	Current control
Magnetic field size	±3T (8K~300K full temperature range)
Magnetic field homogeneity	0.5% 10mm diameter; 1% 25mm diameter
Temperature Sensor	7
Temperature control stability	<10 K @ ±50 mK
	10 K to 100 K @ ±10 mK
	100 K to 300 K @ ±10 mK
Vacuum chamber	Dimensions: 325mm outer diameter x 477mm high
Observation window diameter	50mm
Probe arm interface	6 probe arm interfaces (compatible with DC arm, fiber optic arm, RF arm)
Vacuum degree	30 min (to reach <5 × 10-3 Torr)
	At room temperature, the ultimate vacuum is <7×10^-4 (Torr)
	At low temperature, the ultimate vacuum is <7×10^-7 (Torr)
Probe station cooling time (8K)	＜15h
Probe station temperature recovery time (290K)	＜18h (upgradeable heating module, temperature recovery time is better than 4h)
software	With control software, one-key cooling, one-key temperature return, automatic temperature control, automatic field control
software	Upgradable automatic test software
Dimensions (L x W x H)	Dimensions: 872x962x1400mm (including microscope)
weight	Weight: 300KG (single unit)

CRX-SM Low-Temperature Superconducting Vacuum Probe Station

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