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Custom Temperature Chucks

●High and low-temperature heating chuck in semiconductor testing, ●Conducted on wafers or chips under various thermal conditions. ●-65° ℃ -300° ℃ CDA air cooling, electric cooling ●Temperature uniformity ± 0.5 ℃, ●Maximum withstand voltage 10 KV, ●Maximum withstand current 500A ●Leakage accuracy 300 fA

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Tri-axis fixture

Leakage current accuracy below 100 fA

Leakage flow (tip diameter 20um): 10KV/3KV

Working temperature: -55℃~300℃

1.8m tri-axis dual-shielded cable, equipped with a three-axis male connector (adapters available to match customer testing instruments)

It is recommended to use a probe holder with CB-40-T grade or higher accuracy.

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Coaxial Fixture

Leakage current accuracy can reach 10 pA (when used with a shielding box).

Maximum current rating: 1A

High voltage: 700V

1.5M coaxial cable, coaxial male connector

It is recommended to use a probe holder with accuracy equal to or better than CB-40-T.

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CB-200 Micropositioner

0.5µm optional travel accuracy

DC Test Probe Socket

RF Test Probe Socket

Linear motion

Four-dimensional adjustment

X-Y-Z travel range can reach up to 20mm

Magnetic adsorption and vacuum adsorption options available

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CB-100 Probe Holder

0.5 / 0.7 / 2 / 10 µm optional travel accuracy

DC Test Probe Socket

RF Test Probe Socket

Linear motion

Four-dimensional adjustment

X-Y-Z travel range can reach up to 20mm

Magnetic adsorption and vacuum adsorption options available

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CB-40-T Probe Holder

0.5 / 0.7 / 2 / 10 µm optional travel accuracy

DC Test Probe Socket

RF Test Probe Socket

Linear motion

Four-dimensional adjustment

X-Y-Z travel range can reach up to 20mm

Magnetic adsorption and vacuum adsorption options available

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CB-40 Probe Holder

0.5 / 0.7 / 2 / 10 µm optional travel accuracy

DC Test Probe Socket

RF Test Probe Socket

Linear motion

Four-dimensional adjustment

X-Y-Z travel range can reach up to 20mm

Magnetic adsorption and vacuum adsorption options available

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