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CL-6 Mid-Range Probe Station
CINDBEST high-power device characterization system is specifically designed for testing high-power devices directly on wafers.
The CINDBEST CL-6 and CH-8 probe station systems offer complete solutions for both 150 mm and 200 mm wafers.
They are designed to enable low-contact-resistance measurements of power semiconductors across a wide temperature range.
CL Series Mid-Range Probe Station
- Description
- Parameters
- Download
- Video
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Uses
- Can be used for optoelectronic testing applications, including light intensity and wavelength measurements for LEDs, LDs, and PDs.
- RF testing is available, with the option to install East/West-facing pin connectors—ideal for general use in university laboratories.
Ergonomics and optional features
- Adjustable needle holder platform enables quick lifting and lowering, facilitating rapid separation of samples and probes.
- Chuck rotates and locks in place
- The needle holder platform accommodates DC/RF positioners (magnetic or vacuum-mounted).
- Offering a variety of configurations, including multiple chuck options, micro-positioners, microscopes, cameras, PCB holders, and more.
- Optional instrument racks, vibration isolation tables, dark boxes, and more
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Technical specifications
Model CL-6
Truncated pyramid
Chuck size
6 inches
Sample stage drawer
Quick pull
Sample stage rotation
Rotates 360 degrees, with fine adjustment capability of 15 degrees and precision down to 0.1 degree—equipped with an angle-lock mechanism.
Sample Fixing Method
Vacuum adsorption, central suction port, multi-ring adsorption ring
Sample stage Z-axis lifting and lowering
Adjustable by 8mm
X-Y Travel Distance
6 inches by 6 inches
X-Y Motion Accuracy
5um
Needle holder platform
The needle holder platform features a rapid 5mm lifting and lowering stroke, complete with a locking mechanism.
Back Electrode Testing
The sample stage is electrically isolated and suspended, with a 4mm jack available for connecting the back electrode (optional).
Microscope
Microscope Mounting Method
Gantry with X-Y fine adjustment, travel range 2" × 2"
Microscope Portability
Equipped with a rapid tilting mechanism for easy objective lens replacement, and featuring a pneumatically operated lifting module with a locking function (optional).
Microscope Types
Single-lens microscope
Stereo microscope
Metallographic Microscope
Magnification power
0.75x-5x zoom
16X-100X
20X-4000X
Light source
Coaxial light source
External LED Ring Light
CCD
2-megapixel (upgradable to 20-megapixels)
Probe holder
X-Y-Z Travel Distance
12mm x 12mm x 12mm / 20mm x 20mm x 20mm
Mobile precision
10um/2um/0.7um/0.5um
Adsorption method
Magnetic adsorption / Vacuum adsorption
Probe Fixture
Cables
Coaxial cable / Triaxial cable / RF cable
Leakage current accuracy
10pA/100fA/10fA
Fixed probe
Spring fixation / Tubular fixation / Claw-type fixation
Connector Type
BNC / Three-axis / Banana Plug / Alligator Clip / Terminal Block / RF Connector
Probe
DC needle tip diameter
1um/2um/5um/10um/20um/50um/100um
RF probe frequency
40GHz/50GHz/67GHz/110GHz/1100GHz
Material
Tungsten steel / Beryllium copper / Nickel-plated
External dimensions
750W x 815D x 650H
Weight
About 80 kilograms
Optional accessories
Heating stage
Gold-plated chuck
High-Voltage Testing Accessories
Seismic-resistant desk
Shielding box
Laser system
Customized according to customer requirements