-
Products
-
-
-
-
-
Contact Us
CL-6 Mid-End Probe Station
Cindbest high-power device characterization system is specifically designed for testing high-power devices directly on wafers.
The Cindbest probe station systems offer complete solutions for both 150 mm and 200 mm wafers.
They are designed to enable low-contact-resistance measurements of power semiconductors across a wide temperature range.
CL Series Mid-Range Probe Station
- Description
- Parameters
- Download
- Video
-
Application
- Can be used for optoelectronic testing applications, including light intensity and wavelength measurements for LEDs, LDs, and PDs.
- RF testing is available, with the option to install East/West-facing pin connectors—ideal for general use in university laboratories.
vPD laser machine
Used for metal cutting inside the chip, Mark point marking
●Three-band laser
●Wavelengths include 1064nm, 532nm, 355nm
●Repetition frequency: internal trigger 1Hz; external trigger is possible
●Laser energy: 1mJ
●Light scattered eastward: 5~6mrad
●Laser pulse width:--10 ns
●Cooling method: air cooling
●Built-in CCD camera
●Minimum cutting size: 2um
●Warranty: One year
●Lifespan:>3 million times
Ergonomics and optional features
- Adjustable needle holder platform enables quick lifting and lowering, facilitating rapid separation of samples and probes.
- Chuck rotates and locks in place
- The needle holder platform accommodates DC/RF positioners (magnetic or vacuum-mounted).
- Offering a variety of configurations, including multiple chuck options, micro-positioners, microscopes, cameras, PCB holders, and more.
- Optional instrument racks, vibration isolation tables, dark boxes, and more
Description
• 6" chuck, with central vacuum hole and multi-ring vacuum adsorption for securing samples, controlled by 3 independent switches.
• X-Y movement range of the chuck: 6'' X 6'', movement precision: 10 microns.
• Chuck can rotate 360 degrees, fine adjustment precision no greater than 0.1 degrees, equipped with a locking knob.
• Chuck Z-axis lift, with a travel range of 8mm, fine adjustment precision of 2μm, and a locking mechanism.
• Microscope with a rotary design around a column, enabling quick movement, with a movement range covering the sample stage.
• Overall dimensions:580mm x530mm x690mm (with microscope)
• Weight: About 80kg -
Technical specifications Model CL-6 Truncated pyramid Chuck size 6 inches Sample stage drawer Quick pull Sample stage rotation Rotates 360 degrees, with fine adjustment capability of 15 degrees and precision down to 0.1 degree—equipped with an angle-lock mechanism. Sample Fixing Method Vacuum adsorption, central suction port, multi-ring adsorption ring Sample stage Z-axis lifting and lowering Adjustable by 8mm X-Y Travel Distance 6 inches by 6 inches X-Y Motion Accuracy 5um Needle holder platform The needle holder platform features a rapid 5mm lifting and lowering stroke, complete with a locking mechanism. Back Electrode Testing The sample stage is electrically isolated and suspended, with a 4mm jack available for connecting the back electrode (optional). Microscope Microscope Mounting Method Gantry with X-Y fine adjustment, travel range 2" × 2" Microscope Portability Equipped with a rapid tilting mechanism for easy objective lens replacement, and featuring a pneumatically operated lifting module with a locking function (optional). Microscope Types Single-lens microscope Stereo microscope Metallographic Microscope Magnification power 0.75x-5x zoom 16X-100X 20X-4000X Light source Coaxial light source External LED Ring Light CCD 2-megapixel (upgradable to 20-megapixels) Probe holder X-Y-Z Travel Distance 12mm x 12mm x 12mm / 20mm x 20mm x 20mm Mobile precision 10um/2um/0.7um/0.5um Adsorption method Magnetic adsorption / Vacuum adsorption Probe Fixture Cables Coaxial cable / Triaxial cable / RF cable Leakage current accuracy 10pA/100fA/10fA Fixed probe Spring fixation / Tubular fixation / Claw-type fixation Connector Type BNC / Three-axis / Banana Plug / Alligator Clip / Terminal Block / RF Connector Probe DC needle tip diameter 1um/2um/5um/10um/20um/50um/100um RF probe frequency 40GHz/50GHz/67GHz/110GHz/1100GHz Material Tungsten steel / Beryllium copper / Nickel-plated External dimensions 750W x 815D x 650H Weight About 80 kilograms Optional accessories Heating stage Gold-plated chuck High-Voltage Testing Accessories Seismic-resistant desk Shielding box Laser system Customized according to customer requirements