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Iron-Based Piezoelectric Analyzer TF Analyzer 2000E
FE Module – Ferroelectric Standard Testing;
MR Module – Testing of Magnetoresistive and Ferromagnetic Materials;
RX Module – Relaxation Current Testing;
DR Module - Self-Discharge Test.
Testing instrument
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The TF ANALYZER 2000E is a highly scalable, modular ferroelectric and piezoelectric analyzer equipped with comprehensive testing capabilities for all fundamental properties of ferroelectric, piezoelectric, and pyroelectric materials. It can be seamlessly integrated with micro-displacement sensors such as laser interferometers and SPM scanning probe microscopes, making it an ideal tool for research in diverse areas—including various ferro-/piezo-/pyroelectric thin films, thick films, bulk materials, electronic ceramics, as well as ferroelectric sensors, actuators, and memory devices.
The modularly designed TF Analyzer 2000 E offers exceptional scalability.- FE Module – Ferroelectric Standard Testing;
- MR Module – Testing of Magnetoresistive and Ferromagnetic Materials;
- RX Module – Relaxation Current Testing;
- DR Module - Self-Discharge Test.
Tested basic units include a fully integrated dedicated computer host, along with test boards, operational amplifiers, data processing units, and more. The system also features the Windows 7 operating system and specialized testing software for ferroelectric analyzers.
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FE Module Standard Testing Function:
- Dynamic Hysteresis: Dynamic hysteresis loop test frequency (standard FE module: 0.001 Hz to 5 kHz);
- Static Hysteresis Loop Test;
- PUND Pulse Testing;
- Fatigue testing;
- Retention: Retaining power;
- Imprint: Traces;
- Leakage current test;
- Thermo Measurement Variable-Temperature Testing Function.
FE Module Optional Test Function ：
- C-V curve: Capacitance-Voltage Curve;
- Piezo Measurement: Piezoelectric Performance Testing;
- Pyroelectric Measurement: Thermal Emission Property Testing;
- In-situ Compensation;
- DLCC Dynamic Leakage Current Compensation Function.
Technical Note:
- Voltage range: ±25 V (optional additional high-voltage amplifier can extend up to ±10 kV);
- Electrostrictive frequency: 5 kHz (standard FE module);
- Minimum pulse width: 2 μs;
- Minimum rise time: 1 μs;
- Current amplification range: 1 pA to 1 A;
- Maximum load capacitance: 1 μF;
- Output current peak: ±1 A.
Scalable components:
High-voltage amplifiers, laser interferometers, AFMs, temperature controllers, thin-film probe-based heating and cooling stages, variable-temperature bulk sample holders, bulk furnaces with temperature control, thin-film E31 testing platforms, superconducting magnets, PPMS systems, and more.
The MR module is used to study magnetoresistance and ferromagnetic materials.
This module provides continuous current excitation and testing, with voltage drops across the sample measured using a high-precision four-point method.
The RX module is designed to study polarization and depolarization currents in dielectric and ferroelectric materials—specifically, the current response following an applied voltage step. 。
This test can separate the material's relaxation current from the leakage current, and it also allows for the recording of both the polarization response current and the depolarization response current.
The DR module is used to study the self-leakage properties of dielectric materials.
Since the test conditions closely mimic real-world scenarios, this approach makes it easy to evaluate the suitability of materials for use in DRAM.
For industrial applications, the TF Analyzer 2000E offers 256 automated test channels, significantly expanding the instrument's testing capabilities.
All of the above modules can be selected individually or combined freely, depending on your testing needs and research focus.