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CH-8-D Double-Sided PCB Testing Probe Station
The CINDBEST CH-8-D double-sided probing station is designed for wafer and PCB testing, enabling simultaneous probing on both the front and back sides to meet diverse optical and electrical performance testing requirements.
This custom probe station features an excellent mechanical system, a stable structure, ergonomic design, and multiple upgraded functionalities.
CH Series High-End Probe Station
- Description
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Application
The CINDBEST CH-8-D double-sided point-probe station is designed for wafer and PCB board testing, ideal for applications requiring simultaneous probing on both the front and back sides to meet diverse optical and electrical performance testing needs. This custom probe station features an advanced mechanical system, a robust and stable structure, ergonomic design, and several upgraded functionalities. It is widely applicable across manufacturing and research fields, including integrated circuits, wafers, LEDs, LCDs, solar cells, and more.
• Mobile Platen BAR, you can choose any position to place the needle holder, magnetic reversal adsorption
• Applicable industries: (TFT-LCD industry, STN-LCD industry, OLED industry, semiconductor industry, optoelectronics factory) or PCB factory
• Supports 2 independent microscope XY translation stages
• Integrated air-floating shockproof design, natural frequency: 1.5Hz (horizontal) 2Hz (vertical), bracket with casters, including air compressor.
Description
• 8-inch double-sided test probe station
• Support simultaneous needle tapping on both sides
• Pneumatic lifting platform, can be used for double-sided needle insertion when lifting the platform, and can be used as a conventional probe station when lowering the platform
• 8 "chuck, sample stage electrically independent suspended, 4mm socket can be connected to the back pole, using a central adsorption hole and multiple adsorption rings to fix the sample, both independently controlled, with a minimum selection of 250 microns for the central adsorption hole
• The chuck adopts air floating movement method, which can quickly position 360 °
• The standard chuck can rotate 360 degrees without clearance
XY platform with air floating quick movement function, can quickly locate
X/Y-axis seamless movement, large handle rotation control, stroke: 8 inches X 8 inches, movement accuracy: 1um, with locking device• Overall dimensions: 750W x 820D x 650H (for reference only).
• Weight: 120 KG. -
Technical specifications Model CH-8-D Double-Sided Probe Station Truncated pyramid Chuck size 8 inches Horizontal rotation The chuck can rotate 360 degrees, with fine adjustment accuracy of no more than 0.1 degree, and features a locking knob. XY Travel Distance 8 inches by 8 inches XY Movement Accuracy 10 µm / 1 µm optional Sample fixation Sample clamp with adjustable size; vacuum adsorption for secure holding, and the chuck’s multi-ring suction zone can be independently controlled. Double-sided dotting needle platform The pneumatic lift platform rises to form a dual platform, and when lowered, it can be used as a single platform. Number of platform pin sockets A single platform can hold up to 8 CB-200 pin sockets. Chuck Structure Options available for standard, high-temperature, and back-contact electrode structures Temperature control system Temperature range Room temperature ~200°C (300°C, 400°C, and 500°C options available) Temperature control resolution 0.1℃ Temperature control stability ±1°C Temperature control sensor 100 Ω Platinum Resistance Sensor Front-facing optical system CCD 200W / 500W / 1200W pixels available (both sides) Microscope Types Single-tube/Zoom/Stereo/Metallurgical microscopes available Magnification power 16X-100X/20X-2000X Microscope Adjustment Rotate horizontally around the column, with X-Y movement of 2 × 2 inches, and a Z-axis stroke of 50.8 mm. Light source External LED Ring Light / Coaxial Light Source Rear optical system Microscope Types L-Shaped Monocular Microscope Continuous zoom ratio 6.3:1 Magnification range 0.75 – 5X Magnification power 315X (Calculation formula: Zoom × CCD × Display) Microscope Adjustment Omni-directional Mobility Light source Coaxial light source