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CH-8-D Double-Sided Probe Station


The CINDBEST CH-8-D double-sided probing station is designed for wafer and PCB testing, enabling simultaneous probing on both the front and back sides to meet diverse optical and electrical performance testing requirements.

This custom probe station features an excellent mechanical system, a stable structure, ergonomic design, and multiple upgraded functionalities.

Category:

CH Series High-End Probe Station

  • Description
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  • The CINDBEST CH-8-D double-sided point-probe station is designed for wafer and PCB board testing, ideal for applications requiring simultaneous probing on both the front and back sides to meet diverse optical and electrical performance testing needs. This custom probe station features an advanced mechanical system, a robust and stable structure, ergonomic design, and several upgraded functionalities. It is widely applicable across manufacturing and research fields, including integrated circuits, wafers, LEDs, LCDs, solar cells, and more.

  • Technical specifications

    Model

    CH-8-D Double-Sided Probe Station

    Truncated pyramid

    Chuck size

    8 inches

    Horizontal rotation

    The chuck can rotate 360 degrees, with fine adjustment accuracy of no more than 0.1 degree, and features a locking knob.

    XY Travel Distance

    8 inches by 8 inches

    XY Movement Accuracy

    10 µm / 1 µm optional

    Sample fixation

    Sample clamp with adjustable size; vacuum adsorption for secure holding, and the chuck’s multi-ring suction zone can be independently controlled.

    Double-sided dotting needle platform

    The pneumatic lift platform rises to form a dual platform, and when lowered, it can be used as a single platform.

    Number of platform pin sockets

    A single platform can hold up to 8 CB-200 pin sockets.

    Chuck Structure

    Options available for standard, high-temperature, and back-contact electrode structures

    Temperature control system

    Temperature range

    Room temperature ~200°C (300°C, 400°C, and 500°C options available)

    Temperature control resolution

    0.1℃

    Temperature control stability

    ±1°C

    Temperature control sensor

    100 Ω Platinum Resistance Sensor

    Front-facing optical system

    CCD

    200W / 500W / 1200W pixels available (both sides)

    Microscope Types

    Single-tube/Zoom/Stereo/Metallurgical microscopes available

    Magnification power

    16X-100X/20X-2000X

    Microscope Adjustment

    Rotate horizontally around the column, with X-Y movement of 2 × 2 inches, and a Z-axis stroke of 50.8 mm.

    Light source

    External LED Ring Light / Coaxial Light Source

    Rear optical system

    Microscope Types

    L-Shaped Monocular Microscope

    Continuous zoom ratio

    6.3:1

    Magnification range

    0.75 – 5X

    Magnification power

    315X (Calculation formula: Zoom × CCD × Display)

    Microscope Adjustment

    Omni-directional Mobility

    Light source

    Coaxial light source

CH-8-D彩页

CH-8-D双面点针探针台-PPT