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Iron-Based Piezoelectric Analyzer TF Analyzer 1000
The TF ANALYZER 1000 is a compact ferroelectric and piezoelectric analyzer equipped with all the essential testing capabilities for ferroelectric and piezoelectric materials. It can be seamlessly integrated with micro-displacement sensors such as laser interferometers and SPM scanning probe microscopes, making it ideal for analyzing and testing thin films, thick films, bulk ceramics, and ferroelectric devices.
Category:
Testing instrument
- Description
- Parameters
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Testable features:
The aixPlorer software is tested on the Windows 7 operating system and offers exceptionally user-friendly operation.
Test feature:
- Dynamic Hysteresis Loop: Test frequency range 0.01 Hz to 1000 Hz
- Fatigue: 50 kHz
- Retention
- Imprint
- Leakage Current Test
- C(V) Curve Testing
- Piezoelectric performance testing (butterfly curve, d33 curve)- Thermal Performance Testing (Thermo Measurement)
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Key technical specifications:
- Voltage range: Standard at ±12V (expandable up to ±10kV)
- Test frequency: 0.01 Hz to 1000 Hz
- Maximum fatigue test frequency: 50 kHz
- Minimum pulse width: 20 μs
- Output impedance: 50Ω
- Maximum capacitance: 100 nF
- Output current: ±50mA
- Current amplifier: Current range: 1 nA to 1 A