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CS Compact Probe Station
The CS series probe station features a compact design, high measurement accuracy, and user-friendly operation, all while adhering to ergonomic principles.
Primarily used for testing in the semiconductor and optoelectronics industries.
Widely used in the research and development of precision electrical measurements for complex, high-speed devices.
CS Series Mini Probe Station
- Description
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Application
- Can be used for optoelectronic testing applications, including light intensity and wavelength measurements for LEDs, LDs, and PDs.
- RF testing is available, with the option to install East/West-facing pin connectors—ideal for general use in university laboratories.
Ergonomics and optional features
- Adjustable needle holder platform enables quick lifting and lowering, facilitating rapid separation of samples and probes.
- Chuck rotates and locks in place
- The needle holder platform accommodates DC/RF positioners (magnetic or vacuum-mounted).
- Offering a variety of configurations, including multiple chuck options, micro-positioners, microscopes, cameras, PCB holders, and more.
- Optional instrument racks, vibration isolation tables, dark boxes, and more
Description
• 4" chuck, with central vacuum hole and multi-ring vacuum adsorption for securing samples, controlled by 3 independent switches.
• X-Y movement range of the chuck: 4'' X 4'', movement precision: 10 microns.
• Chuck can rotate 360 degrees, fine adjustment precision is no greater than 0.1 degrees, equipped with a locking knob.
• Chuck Z-axis lift, with a travel range of 8mm, fine adjustment precision of 2μm, and a locking mechanism.
• Microscope with a rotary design around a column, enabling quick movement, with a movement range covering the sample stage.
• Overall dimensions: 400W*400D*500H (for reference only).
• Weight: 26KG. -
Technical specifications Model CS-4 CS-6 Truncated pyramid Chuck size 4 inches 6 inches Sample stage rotation Rotates 360 degrees, with fine adjustment capability of 15 degrees and precision down to 0.1 degree—equipped with an angle-locking mechanism. Sample Fixing Method Vacuum adsorption, central suction port, multi-ring adsorption ring Sample stage Z-axis lifting and lowering Adjustable by 8mm X-Y Travel Distance 4 inches by 4 inches X-Y Motion Accuracy 10um Needle holder platform U-shaped probe holder platform capable of accommodating up to 6 probe sockets Back Electrode Testing The sample stage is electrically isolated and suspended, with a 4mm jack available for connecting the back electrode (optional). Microscope Microscope Mounting Method Pillar-rotating type Microscope Types Single-lens microscope Stereo Microscope Magnification power 0.75x-5x zoom 16X-100X Light source Coaxial light source External LED Ring Light CCD 2-megapixel (upgradeable to 20-megapixels) Probe holder X-Y-Z Travel Distance 12mm x 12mm x 12mm / 20mm x 20mm x 20mm Mobile precision 10um/2um/0.7um/0.5um Adsorption method Magnetic adsorption / Vacuum adsorption Probe Fixture Cables Coaxial cable / Triaxial cable / RF cable Leakage current accuracy 10pA/100fA/10fA Fixed probe Spring fixation / Tubular fixation / Claw-type fixation Connector Type BNC / Three-axis / Banana Plug / Alligator Clip / Terminal Block / RF Connector Probe DC needle tip diameter lum/2um/5um/10um/20um/50um/100um RF probe frequency 40GHz/50GHz/67GHz/110GHz Material Tungsten steel / Beryllium copper / Nickel-plated External dimensions 400W x 400D x 500H Weight Approximately 26 kilograms Optional accessories Heating stage Gold-plated chuck Seismic-resistant desk Shielding box Customized according to customer requirements
CS-4
CS-4