-
Products
-
-
-
-
-
Contact Us
3672A/B/C/D/E Vector Network Analyzer
Testing instrument
- Description
- Parameters
- Download
- Video
-
Key Features
-
Flexible calibration options available, compatible with a variety of calibration standards.
-
Supports multi-window and multi-channel measurements, enabling rapid execution of complex test scenarios.
-
Features multiple display formats, including logarithmic magnitude, linear magnitude, standing wave ratio, and the Smith chart.
-
Features USB, GPIB, LAN, and VGA interfaces
-
Chinese/English operating interface, with a 12.1-inch 1280x800 high-resolution multi-touch display
-
Record/Run—single-click operation simplifies measurement setup steps, boosting productivity.
-
Features include integrated pulse S-parameter measurement, time-domain measurement, mixer characterization, two-dimensional gain compression scanning, support for THz frequency-hopping, and capabilities for antenna and RCS measurements.
The user-friendly interface is simple and intuitive, making it easy to operate and boosting testing efficiency.
Flexible calibration options available, compatible with a variety of calibration standards.
The 3672 Series Vector Network Analyzer offers a variety of calibration options, including wizard-based calibration (automated calibration), non-wizard calibration methods (such as through-response calibration using mechanical calibration standards, through-response and isolation calibration, single-port calibration, enhanced response calibration, full two-port SOLT calibration, and TRL calibration). Additionally, it supports both coaxial 3.5mm calibration standards and electronic calibration units, allowing users to easily select the appropriate calibration kit based on the specific testing requirements for devices with different interface types.
Multi-window display of all measurement channels
This product features multi-channel and multi-window display capabilities, supporting up to 64 channels and allowing simultaneous display of up to 16 measurement windows—each window can show up to 8 test traces at once—making observation results more intuitive and enhancing user convenience.
Recording feature enables one-click automated testing
Record all operation steps taken by the user while using the instrument, while also allowing users to insert custom prompt dialog boxes at any time. Additionally, the system can trigger these prompts precisely on schedule, waiting for user confirmation—enabling seamless user interaction and truly delivering a smart, one-click automation feature for the instrument.
Wide Dynamic Range
The 3672 series vector network analyzer employs a mixer-based receiver design, effectively expanding the instrument's overall test dynamic range and perfectly meeting your requirements for high-dynamic-range measurements.
Rich in peripheral interfaces, flexible and practical
The 3672 Series Vector Network Analyzer features a PC-compatible embedded computer module and a Windows-based software-hardware platform, seamlessly integrating the test instrument with a personal computer. Users can leverage its extensive I/O interfaces—including GPIB, USB, and LAN—to perform data communication tests.
Trace noise is low, and measurement accuracy is high.
The 3672 series vector network analyzer boasts exceptional trace noise performance, significantly enhancing the overall measurement accuracy of the instrument. This makes it perfectly suited to meet users' demands for precise measurements, particularly excelling in the accurate evaluation of low-insertion-loss devices. (The figure below illustrates this with the 3672B model as an example.)
Time-domain analysis
The 3672 Series Vector Network Analyzer allows seamless switching between frequency-domain and time-domain measurement results by configuring the Time-Domain Measurement Option, enabling precise identification of discontinuity locations in devices, fixtures, or cables—and ultimately facilitating accurate fault localization.
Tall Time-Domain Reflectometry (TDR Option)
With the rapid growth of the information industry, the demand for network bandwidth is soaring, requiring information devices—such as large servers, computers, and switches—to handle ever-faster data rates. As a result, manufacturers of information equipment are paying increasing attention to signal integrity issues in high-speed interconnect channels. Variations in the characteristics of transmission links can significantly impact signal quality, making advanced time-domain analysis options an essential tool for evaluating the performance of high-speed link signal transmission.
TDR time-domain impedance testing accurately measures changes in the impedance characteristics of transmission lines and helps pinpoint discontinuities.
Convenient near-end and far-end crosstalk testing, capable of simultaneously analyzing time-domain and frequency-domain data to assess the extent of mutual interference between multiple transmission lines.
The advanced time-domain analysis option provides virtual eye diagram generation and analysis capabilities based on S-parameters. The simulation pattern output unit is used to generate data bits that alternate between 0 and 1; these simulated patterns are then convolved with the device under test’s time-domain impulse response, and the resulting waveforms are superimposed to produce the virtual eye diagram.
Depending on the specific high-speed digital communication standard, the advanced time-domain analysis option can perform efficient Pass/Fail testing using pre-defined eye diagram templates.
The advanced time-domain analysis option allows you to introduce disturbances such as jitter and noise onto the simulation eye diagram. By incorporating equalization and pre-emphasis correction algorithms, it simulates eye diagrams at various points along a high-speed link under real-world conditions.
Automatic fixture removal feature enables testing of non-standard connector devices.
The measurement objects of a vector network analyzer include non-standard connector devices, such as packaged microwave components and on-chip devices. A key characteristic of these devices is that they cannot be directly connected to the vector network analyzer. While fixtures can be used to link the device under test to the analyzer, they also introduce fixture-related errors. Fortunately, an automatic fixture removal feature enables the extraction, storage, and de-embedding of fixture parameters, allowing users to obtain the true parameters of the device under test. This feature is both easy to operate and highly accurate.
When describing the fixture, you can configure either a single-ended fixture or a differential fixture, and you can also specify details like the number of fixture ports. To extract fixture parameters, it’s necessary to measure the fixture standards. On the standard description interface, the fixture standards are categorized into three types: through-standard, open-circuit standard, and short-circuit standard.
Using the automatic fixture removal feature, the Device Under Test is treated as a single unit for balanced parameter extraction, followed by four-port de-embedding. Test results show that the transmission parameters have been effectively removed, and both near-end crosstalk and far-end crosstalk have also been successfully eliminated.
Typical Applications
Gain-compression 2D scanning enhances testing efficiency.
The gain compression measurement application for active devices such as amplifiers (Option S86) requires just one setup, one connection, and one calibration to obtain all frequency-domain gain compression parameters of the amplifier—including the input power at the compression point, the output power at the compression point, and the gain at the compression point—as well as its linear parameters, such as linear gain, input matching, and output matching. It features:
-
Fast and accurate smart scanning;
-
Clearly visible guide calibration;
-
Convenient and fast USB electronic calibration, USB power calibration;
-
Two-dimensional scanning (frequency-point sweep power and power-point sweep frequency) is completed in one go;
-
Various compression methods—including linear/max gain compression, saturation-based compression, the fallback method, and the X/Y technique.
Mixer/Converter Testing
The 3672 Series Vector Network Analyzer’s four-port measurement option (available as options 400, S82, S83, and S84) features a built-in dual-source capability, enabling comprehensive scalar and vector parameter testing of mixers/converters.
1) Mixer/Converter Scalar Parameter Measurement
The mixer/converter scalar measurement application option (S82 option) allows you to obtain all scalar parameters in the frequency domain, including input/output port matching, conversion gain, and input/output power levels. Compared to previous testing methods, its key advantage lies in:
-
One-time connection setup, with multi-parameter testing completed in a single go;
-
User-friendly, simplified calibration interface;
-
Convenient and fast USB electronic calibration, USB power calibration;
-
Built-in dual excitation sources eliminate the need for an external signal source to provide the local oscillator signal;
-
Port-based power calibration technology;
-
Meeting users' needs for high-accuracy scalar parameter testing of mixers.
2) Vector Parameter Measurement of Mixers/Frequency ConvertersThe Vector Mixer/Frequency Converter Device Test Application Option (S83 Option) is a test software package that integrates measurements of key parameters for frequency conversion devices, including conversion loss or gain, port input/output power (forward and reverse), voltage standing wave ratio (VSWR), phase, and group delay. Its main features include:
-
The measurement process requires characterization using a reference mixer;
-
Built-in dual excitation sources eliminate the need for an external signal source to provide the local oscillator signal;
-
The test parameters are comprehensive, and compared to scalar mixer testing, they now include additional functionality for measuring parameters such as phase and group delay.
Filter Testing
The 3672 series vector network analyzer features a filter test menu that allows users to obtain all passband characteristics of the filter in the frequency domain (including bandwidth, center frequency, Q value, left cutoff frequency, right cutoff frequency, and more) as well as stopband metrics such as dynamic range and isolation. It offers:
-
Fast and accurate segment scanning;
-
A clear and straightforward calibration guide;
-
Fast, high-precision electronic calibration technology;
-
Passband and stopband specifications are measured in a single step.
Integrated Pulse S-Parameter Testing
The 3672 series vector network analyzer features a pulse-modulated signal output, enabling S-parameter measurements in pulsed mode. It includes:
-
Built-in four-channel pulse generator and pulse modulator—ports 1 and 3 can output pulse-modulated signals.
-
A complete pulse solution capable of performing in-band fixed-point, pulse envelope, and swept-frequency pulse measurements in both broadband and narrowband modes;
-
It can be synchronized with external pulse generators and pulse modulators to enable sophisticated pulse synchronization testing.
Automated testing
Through the GPIB bus interface and network port, flexible and versatile control methods are provided—simply connect the devices and send commands. We offer you an integrated automated testing solution that includes automatic calibration, automatic measurement, automatic data reading, and automatic printing, among other features.
-
Simple control method: just one network cable and a GPIB card.
-
Effectively reduce costs and free up limited human resources;
-
Completing more tests within the available timeframe significantly shortens the development cycle.
-
Completing tasks that are impossible for humans, such as precise time control and testing in complex environments.
Noise Figure and Noise Parameter Testing
The 3672 Series Vector Network Analyzer Noise Figure Option (Option 003), combined with vector error correction and a unique source-end matching calibration method, delivers highly accurate measurements of noise figure and noise parameters.
The Noise Figure Measurement Option (Option 003) provides the device under test with its noise figure, noise parameters, noise power parameters, and noise correlation matrix. Compared to previous testing methods, its key advantages are:
-
A single connection setup allows for the simultaneous testing of multiple parameters, including noise figure, noise parameters, and S-parameters.
-
Precise measurement of lower noise figures;
-
Wide measurement range (0 dB to 55 dB);
-
Suitable for precise measurement of the on-chip noise figure of chips;
-
Suitable for precise measurement of noise figures in applications such as fixtures and test systems.
-