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Probe Station Selection Guide: How to Choose the Right Probe Station for Your Lab?

The probe station is a critical piece of equipment in the semiconductor and microelectronics fields, used for testing and manipulating tiny samples. When selecting a probe station, it’s essential to carefully consider factors such as specific application needs, laboratory conditions, and budget constraints. This article provides a detailed analysis of probe station selection, helping users choose the model that best meets their unique requirements.

1. Clearly Define Application Requirements

Before selecting a probe station, first clarify your specific application requirements. Different research fields and application scenarios may call for various types of probe stations. For instance, if your application requires testing under high- or low-temperature conditions, you’ll need to choose a probe station equipped with temperature-control capabilities. Similarly, if vacuum environments are necessary for your tests, opt for a probe station featuring a dedicated vacuum system. Therefore, it’s essential to thoroughly understand and define your application needs before making a selection.

2. Consider laboratory conditions

Laboratory conditions are another critical factor to consider when selecting a probe station. For instance, the size of the lab space, power requirements, and interface needs can all influence your choice of probe station. If the lab has limited space, you’ll need to opt for a smaller, more compact probe station; and if the lab has specific demands regarding power supply and interfaces, you’ll have to choose a probe station that meets those exact specifications.

3. Compare the technical specifications of different models

When selecting a probe station, it’s essential to compare the technical specifications of different models, including sample stage size, travel range, positioning accuracy, microscope configuration, temperature control system, and optical setup. These parameters directly influence the probe station’s testing accuracy, stability, and reliability. Therefore, carefully evaluating the technical features of various models is crucial to choosing the one that best meets your specific needs.

4. Consider price and service

Price and service are also key factors to consider when choosing a probe station. Prices can vary significantly across different models, so it’s important to select one that fits your budget. Additionally, you should evaluate the supplier’s service quality, including technical support and after-sales assistance. Choosing a reliable supplier ensures that any issues you encounter during use will be resolved promptly.

V. Summary and Recommendations

In summary, when selecting a probe station, it’s essential to carefully consider factors such as application requirements, laboratory conditions, technical specifications, price, and available services. We recommend conducting thorough market research and demand analysis first, followed by engaging in discussions and comparing offers from multiple suppliers, ultimately choosing the probe station that best meets your specific needs. Additionally, be sure to thoroughly review the supplier’s technical support and after-sales service policies before making a purchase, ensuring that you’ll receive timely assistance and support throughout the product’s lifecycle.

Common Issues with High- and Low-Temperature Vacuum Probe Stations and Corresponding Solutions

Common issues with high- and low-temperature vacuum probe stations, along with their corresponding solutions, include the following:

1. Inaccurate temperature control: This could be caused by a faulty temperature sensor or issues with the control system. The solution is to inspect and replace the temperature sensor, then adjust the control system parameters.

2. Insufficient vacuum level: This could be caused by a faulty vacuum pump, leaking seals, or gas leaks in the pipelines. The solution is to inspect the vacuum pump and seals, and ensure that all pipeline connections are tightly secured.

3. Poor probe contact: This may be caused by probe aging, incorrect probe positioning, or poor surface quality of the sample. Solutions include replacing the probe, adjusting its position, and ensuring the sample surface is smooth and clean.

4. Device fails to heat or cool: This could be due to a malfunctioning heating or cooling component. The solution is to inspect the heating or cooling element and either repair or replace it.

5. Internal equipment contamination: This may be caused by sample or experimental material contamination, or due to poor sealing of the equipment. The solution is to clean the inside of the equipment and replace the sealing gasket.

6. Equipment leakage: This could be caused by aging wires, improper connections, or poor grounding. The solution is to inspect the wires and connections, ensuring that the grounding system is functioning properly.

7. Software crashes or fails to operate properly: This could be caused by software glitches or computer hardware issues. Solutions include restarting the software or your computer, or updating to the latest software version.

8. Excessive Noise: This could be caused by the operation of the vacuum pump, cooling fan noise, and more. The solution is to inspect and clean the vacuum pump, adjust the position of the cooling fan, or replace the bearings.

These are just some of the issues that high- and low-temperature vacuum probe stations may encounter—specific problems will need to be assessed and addressed based on the actual situation. When using the equipment, always prioritize safety precautions and follow proper operating and maintenance procedures.

Common Issues Analysis for Probe Stations

1. How to choose a probe station? Click for selection.

2. How to use and maintain the probe station? Click on "Maintenance."

3. How to select a GGB RF probe? Click here for RF probe selection.

If you have any questions about the probe station, feel free to contact Sheng Dongbao anytime—we’ll be happy to assist you!

GGB RF Probe Selection Method

GGB RF Probe Selection

Suitable for 40A, 40M, 50A, 67A, 110H

Here's an example using 40A:

40A-GSG-150-P-W

40A refers to the probe's maximum test frequency capability—specifically, 40A indicates that this probe can reliably test up to 40 GHz. (Note: The 40M model is an ultra-low-loss probe.)

GSG refers to the number of electrodes corresponding to the probe, with optional shapes such as GSG, GS, and SG. Additionally, for configurations involving multiple probes, you can explore the dual selection method.

150 refers to the probe pin pitch—the distance between G and S; the pitch can range from 25 µm to 2,540 µm.

P refers to the connector shape of the probe head, and there are 12 distinct structures in total.

W refers to the material of the probe tip—specifically, tungsten steel, with beryllium being the standard option.