Products

Products

• Probe station

• Two-Dimensional Material Transfer Platform

• Accessories

• Radio Frequency Probe

• Testing instrument



• CM Simple Probe Station

• CS Series Compact Probe Station

• CL Mid-End Probe Station

• CH High-End Probe Station

• CH-8-D Double-Sided Probe Station

• PCB Probe Station Series

• CT Non-Vacuum High- and Low-Temperature Probe Station

• CGO-2 Magnetic Field Cryogenic Probe Station

• CRX Series Closed-Loop Vacuum Cryogenic Probe Station

• M001 Vacuum High- and Low-Temperature Probe Station

• M002 Vacuum High- and Low-Temperature Probe Station

• CRX-SM Cryogenic Superconducting Vacuum Probe Station

• CP Series Semi-Automatic Probe Station

• EMMI Photon Micro-Leakage Analysis Probe Station

• Fully Automatic Probe Station

• CBC-ER4 2D Transfer Platform

• CB-200 Probe Holder

• CB-100 Probe Holder

• CB-40-T Probe Holder

• CB-40 Probe Holder

• Three-axis fixture

• Coaxial Fixture

• GGB RF~110 GHZ Probe

• Keithley 2600 Series

• Keithley 2400

• Pursuit S300

• FS-Pro Semiconductor Parameter Tester

• Iron-Based Piezoelectric Analyzer TF Analyzer 1000

• Iron-Based Piezoelectric Analyzer TF Analyzer 2000E

• 4051A/B/C/D/E–S Series Signal/Spectrum Analyzers

• 3656A Vector Network Analyzer

• 1435A/B/C/D/F Signal Generator

• 1465C/D/F/H/L Signal Generator

• 3672A/B/C/D/E Vector Network Analyzer

• 1441 Series Signal Generator

• Iron-Based Piezoelectric Analyzer TF Analyzer 3000

• CM Simple Probe Station View Details

• CS Series Compact Probe Station View Details

• CL Mid-End Probe Station View Details

• CH High-End Probe Station View Details

• CH-8-D Double-Sided Probe Station View Details

• PCB Probe Station Series View Details

• CT Non-Vacuum High- and Low-Temperature Probe Station View Details

• CGO-2 Magnetic Field Cryogenic Probe Station Typical applications include sampling IV and CV curves over a wide temperature range, measuring microwave and electro-optic responses, characterizing magnetic transport properties in variable magnetic fields, performing Hall effect measurements to determine carrier mobility, and conducting a variety of other materials research. View Details

• CRX Series Closed-Loop Vacuum Cryogenic Probe Station View Details

• M001 Vacuum High- and Low-Temperature Probe Station View Details

• M002 Vacuum High- and Low-Temperature Probe Station View Details

• CRX-SM Cryogenic Superconducting Vacuum Probe Station View Details

• CP Series Semi-Automatic Probe Station View Details

• EMMI Photon Micro-Leakage Analysis Probe Station View Details

• Fully Automatic Probe Station View Details

• CBC-ER4 2D Transfer Platform View Details

• CB-200 Probe Holder View Details

• CB-100 Probe Holder View Details

• CB-40-T Probe Holder View Details

• CB-40 Probe Holder View Details

• Three-axis fixture View Details

• Coaxial Fixture View Details

• GGB RF~110 GHZ Probe View Details

• Keithley 2600 Series View Details

• Keithley 2400 View Details

• Pursuit S300 View Details

• FS-Pro Semiconductor Parameter Tester View Details

• Iron-Based Piezoelectric Analyzer TF Analyzer 1000 View Details

• Iron-Based Piezoelectric Analyzer TF Analyzer 2000E View Details

• 4051A/B/C/D/E–S Series Signal/Spectrum Analyzers View Details

• 3656A Vector Network Analyzer View Details

• 1435A/B/C/D/F Signal Generator View Details

• 1465C/D/F/H/L Signal Generator View Details

• 3672A/B/C/D/E Vector Network Analyzer View Details

• 1441 Series Signal Generator View Details

• Iron-Based Piezoelectric Analyzer TF Analyzer 3000 View Details

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