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CGO-4-N Open-loop Cryogenic Vacuum Probe Station
High vacuum chamber with 77K-473K (upgradeable to 573K, 773K) temperature range.
Non-destructive electrical analysis for materials and front-end devices
Applied to DC, RF/mmW testing; as well as MEMS and optoelectronic testing, among others.
Provide effective cryogenic operation, using liquid nitrogen or liquid helium for continuous cooling of the system.
No water and frost formation at low temperatures to ensure that the sample is dry.
Affordable - competitive price in it's class.
Intergrated air floting vibration isolation design, smaller space occupation, to provide a good experimental environment for the laboratory.
EMMI Photon Micro-Leakage Analysis Probe Station
CP 200/300 Semi-Automatic Probe Station
Multi-magnification Optical Display System
Compatible with 12”, 8”, 6”, and 4” wafer testing and dicing tests
Internal air suspension system effectively isolates external vibrations.
Integrated control system for rapid access to instrument testing
Software automation testing, precise calibration of mechanical accuracy
X-Y axis travel speed: 70 mm/sec, repeat positioning accuracy: ≤±1 μm
Z-axis travel speed: 20 mm/sec, Z-axis positioning repeatability: ≤ ±μm
R-axis accuracy: 0.0001°, repeat positioning accuracy: ≤±1 μm
CRX-SM Low-Temperature Superconducting Vacuum Probe Station
Temperature range: 8K–300K
Extreme vacuum better than 5 x 10⁻⁶ Torr
Supports 6 probe arms and DC measurements, with leakage current accuracy better than 100 fA.
Supports RF testing with a frequency range of DC to 110 GHz.
Supports optical testing, wavelength range: 190 nm to 2200 nm
Hall measurements and magnetotransport measurements
Magnet type: Superconducting magnet
The CINDBEST CH model probe station is a fully functional, highly versatile probe station.
It can accommodate testing of various samples, especially large-sized ones, such as 8-inch wafers, 12-inch wafers, and more.
It can also accommodate testing for various applications, such as DC testing, RF testing, and more.
Testing IV curves, CV curves, LIV curves, RF testing, and high-voltage, high-current tests
CH-8-D Double-Sided PCB Testing Probe Station
The CINDBEST CH-8-D double-sided probing station is designed for wafer and PCB testing, enabling simultaneous probing on both the front and back sides to meet diverse optical and electrical performance testing requirements.
This custom probe station features an excellent mechanical system, a stable structure, ergonomic design, and multiple upgraded functionalities.
CM-4 Simple Economic Teaching Probe Station
The CM series probe stations feature a compact design, deliver high measurement accuracy, offer convenient operation, and are ergonomically designed for user comfort.
Primarily used for I-V/C-V PIV testing, as well as in testing within the semiconductor and optoelectronics industries.
Widely used in the research and development of precision electrical measurements for complex, high-speed devices.