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RF Coaxial Probe
Radio Frequency Probe
- Description
- Parameters
- Download
- Video
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GGB Industries is a global leader in the field of RF/microwave detection, serving Picoprobe ® Founder of the series.
The 50 ohm coplanar flexible tip coaxial probe patented in 1988 revolutionized wafer detection technology, and in 1992, the W-band probe established a leading position in the industry. The core product covers DC-500GHz RF/microwave probes, with low loss and high durability, suitable for mainstream probe stations.GGB Industries' probe products cover an ultra-wide frequency range from DC to 1.1THz, encompassing core categories such as RF/microwave probes, millimeter-wave probes, waveguide probes, probe cards, and calibration substrates. Its core strengths are reflected in:
一、 Product Scope
1. Frequency Coverage
- RF/Microwave Probes: Supports DC-110GHz. Typical models include Model 40A (DC-40GHz, insertion loss <0.8dB) and Model 67A (DC-67GHz, insertion loss <1.1dB), suitable for 5G communications and IoT chip testing.
- Millimeter-wave/Terahertz probes: Covering 325-500GHz (Model 500B) and the extreme high-frequency band up to 1.1THz, meeting demands in cutting-edge fields like 6G communications, satellite communications, and terahertz imaging.
- Waveguide probes: Provide a full range of waveguide interfaces from WR-22 to WR-3, compatible with testing millimeter-wave devices from 33-500GHz.
- Customized probe cards: Support multi-port, differential signal, and high-density integration. Compatible with mixed layouts of 40/50/67/110GHz RF probes and DC channels, suitable for advanced packaging (e.g., Chiplet) testing.
- Calibration Substrates: Supports SOLT/LRL/TRL/LRM calibration protocols, covering 30-2540μm pitch ranges to ensure test system accuracy.
2. Mechanical Design
- Ultra-Small Dimensions: Contact point diameter <1μm, compatible with nanoscale chips (e.g., FinFET, GAA transistors).
- Multi-pin configurations: Offers 13 pin layouts including GSG, GS, SG, GSSG, supporting simultaneous single-ended/differential signal measurement.
- Non-planar probing capability: Spring-loaded flexible tips (BeCu/tungsten) adapt to curved structures like ceramic substrates and laser diodes, with over 100,000 needle-punch cycles.
3. Application Fields
- Semiconductor testing: Covers the entire process from wafer-level reliability verification and device characterization to RFIC debugging.
- Emerging technologies: Supports interdisciplinary applications including optoelectronic devices (e.g., silicon photonics chips), nanomaterials (e.g., 2D semiconductors), and biomedical fields (e.g., cellular electrical signal detection).
二、Technical Advantages
1. Superior Electrical Performance
- Low-loss transmission: Coaxial design achieves insertion loss <0.8dB (DC-40GHz), <4dB (325-500GHz), and return loss >15dB, meeting high-precision S-parameter measurement requirements.
- High isolation: Crosstalk suppression exceeds -80dB, suitable for testing multiport devices (e.g., MIMO antennas).
- Wide Dynamic Range: Supports full-range detection from microvolt-level weak signals to 250mA high currents (e.g., power amplifiers).
2. Mechanical Reliability
- Durable Structure: Patented flexible tip technology minimizes damage to chip surfaces during testing, enabling long-term repetitive probing on aluminum/gold pads.
- Anti-Interference Design: Shielded coaxial cable combined with ground terminals effectively suppresses EMI/ESD interference.
3. Test Compatibility
- Multi-Platform Adaptability: Integrates with mainstream probe stations like Cascade and FormFactor, compatible with network analyzers from Keysight/Agilent, Anritsu, and others.
- Flexible Calibration Solution: CalKit software enables one-click loading of calibration coefficients, reducing test setup time.
4. Industry Validation
- Market Position: Holds approximately 50% global market share in RF probes, reaching 60% in China, serving leading semiconductor firms like TSMC, Samsung, and Huawei.
- Technical Barriers: Established industry standards with its patented 50-ohm coplanar flexible tip coaxial probe (1988 patent), continuously driving microwave detection technology evolution.
With core attributes of ultra-wide bandwidth, high precision, and exceptional durability, GGB probes have become indispensable testing tools in semiconductor R&D and mass production, particularly dominating high-frequency, high-speed, and highly integrated chip testing applications.
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RF Probes - Selection Guide
40A
50A
67A
110H
Frequency
DC-40GHz
DC-50GHz
DC-67GHz
DC-110GHz
Connectors
2.92mm
2.4mm
1.85mm
1.0mm
Pin structure
GS/SG/GSG
GS/SG/GSG
GS/SG/GSG
GS/SG/GSG
Spacing range
25µ - 2540µ
25µ - 1250µ
25µ - 1250µ
525µ - 1250µ
Insertion loss
<.8db
<1.0db
<1.1db
<1.5db
Return loss
> 18db
>18db
>14db
>15db
Calibration Substrate Selection Guide
Calibration
Substrate
Pad Size (microns)
Calibration
Types
Supported
Footprint
Pitch Range
Recommended
(microns)
Pitch Range
Acceptable
(microns)
CS-5
50 x 50
SOLT, LRL, LRM
GSG
75 - 250
75 -250
CS-9
100 x 100
SOLT, LRL, LRM
GSG
250 - 600
150 - 600
CS-10
150 x 150
SOLT, LRM
GSG
600 - 1250
225 - 1250
CS-18
300 x 300
SOLT, LRM
GSG
1250 - 2540
500 - 2540
CS-8
50 x 50
100 x 100
150 x 150
SOLT, LRM
GS, SG
50 - 200
50 -300
CS-14
100 x 100
SOLT, LRM
GS, SG
200 - 400
150 - 600
CS-11
150 x 150
SOLT, LRM
GS, SG
400 - 1250
175 - 1250
CS-17
300 x 300
SOLT, LRM
GS, SG
750 - 2540
450 - 2540
40GHz
50GHz
67GHz
110GHz
Frequency Range
DC - 40GHz
DC - 50GHz
DC - 67GHz
DC - 110GHz
Length
120cm
120cm
120cm
15cm
Connectors
2.92M – 2.92M
2.4M – 2.4M
1.85 M - 1.85 M
1.0M - 1.0M