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Classification of High- and Low-Temperature Probe Stations and Corresponding Parameter Specifications

A high- and low-temperature probe station is a process testing instrument used in the fields of information science and systems science, primarily for characterizing the electrical properties of microstructured semiconductor devices, microelectronic components, and materials under various environmental conditions and temperature settings. Depending on their specific functions and application areas, high- and low-temperature probe stations can be categorized into several types, including, but not limited to:

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03


2024-04


Overview of Waveguide Probe Features and Their Applications in the Technical Field

Characteristics and Applications of Waveguide Probes A waveguide probe is a device used for transmitting and receiving microwave signals. Its key characteristics and applications are as follows: **Characteristics:** 1. **Directionality:** The waveguide probe exhibits strong directivity, enabling efficient transfer of microwave signals from the waveguide into free space—or vice versa. 2. **High Gain:** Thanks to its highly efficient transmission mechanism, waveguide probes typically offer excellent gain. 3. **Low Loss:** These probes feature minimal transmission loss, making them ideal for effectively conveying microwave signals over long distances.

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2024-04


Classification of high-end probe stations and their application scenarios

Classification of high-end probe stations and their application scenarios A high-end probe station is a critical piece of equipment used for electrical performance testing of semiconductor devices. It primarily consists of mechanical components, probe needles, electrical test instruments, and a control system. Depending on the operation mode, high-end probe stations can be categorized into manual, semi-automatic, and fully automatic types. Additionally, based on their specific functions, these stations can also include temperature-controlled probe stations, vacuum probe stations, and RF probe stations.

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27


2024-03


What is a DC probe, and what are its application areas?

What is a DC probe, and what are its application areas? A DC probe is a testing tool used to measure DC current and voltage in electronic circuits. It typically consists of a needle tip and a probe body, allowing it to make contact with circuit components and accurately measure their DC current and voltage. DC probes have a wide range of applications, primarily including: - Production and testing of electronic products

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2024-03


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