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CM Series Simple Probe Station
CM-4 Simple Economic Teaching Probe Station
The CM series probe stations feature a compact design, deliver high measurement accuracy, offer convenient operation, and are ergonomically designed for user comfort.
Primarily used for I-V/C-V PIV testing, as well as in testing within the semiconductor and optoelectronics industries.
Widely used in the research and development of precision electrical measurements for complex, high-speed devices.