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CH Series High-End Probe Station
The CINDBEST CH model probe station is a fully functional, highly versatile probe station.
It can accommodate testing of various samples, especially large-sized ones, such as 8-inch wafers, 12-inch wafers, and more.
It can also accommodate testing for various applications, such as DC testing, RF testing, and more.
CH-8-D Double-Sided PCB Testing Probe Station
The CINDBEST CH-8-D double-sided probing station is designed for wafer and PCB testing, enabling simultaneous probing on both the front and back sides to meet diverse optical and electrical performance testing requirements.
This custom probe station features an excellent mechanical system, a stable structure, ergonomic design, and multiple upgraded functionalities.