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Fully Automatic Probe Station
Shenzhen Sendongbao Technology Co., Ltd. introduces its fully automatic wafer probe station series, designed to accommodate 4- to 12-inch wafer testing. The equipment supports various test environment configurations, including high/low temperatures, high voltages, and low-leakage setups. Featuring user-friendly operation and exceptional performance stability, these systems boast high precision, remarkable efficiency, minimal vibration, and reduced noise levels.