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CL-6 Mid-End Probe Station

CL-6 Mid-End Probe Station

Cindbest high-power device characterization system is specifically designed for testing high-power devices directly on wafers.

The Cindbest probe station systems offer complete solutions for both 150 mm and 200 mm wafers.

They are designed to enable low-contact-resistance measurements of power semiconductors across a wide temperature range.

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CT-6 Non-Vacuum Low-to-High Temperature

CT-6 Non-Vacuum Low-to-High Temperature

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Closed-loop system

Closed-loop system

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CGO-2 Magnetic Field Probe Station

CGO-2 Magnetic Field Probe Station

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M001 Compact Vacuum High- and Low-Temperature Probe Station

M001 Compact Vacuum High- and Low-Temperature Probe Station

• Temperature range: -196°C to 500°C (upgradable to higher temperature) • Temperature change rate: 0~10°C/min, linearly controllable heating and cooling • Temperature resolution and stability: ±0.1°C • High-precision temperature controller and programmable temperature control software • Control method: PID closed-loop control • Temperature sensor: PT100, 1 unit • Cooling method: Liquid nitrogen (pump-controlled), includes 2L liquid nitrogen tank • Number and material of probes: 4 (gold-plated copper) • Sample stage material and size: Nickel-plated copper, 35*35mm (subject to actual size) • Cold/hot stage dimensions: 160*150mm (subject to actual size) • Optical observation window: φ25mm (subject to actual size) • Vacuum compatible, supports protective gas (nitrogen), with water-cooling interface • Basic configuration: M002 cold/hot stage x1, high/low temperature controller x1, temperature control software x1 • Optional: Computer, installation stand, source meter, coaxial BNC, vacuum system, humidity control system, custom control software

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M002 Vacuum High- and Low-Temperature Probe Station

M002 Vacuum High- and Low-Temperature Probe Station

4-probe, manual positioning, standard match1.5-meter coaxial test cable (coaxial male connector)

Temperature range: -196 to 200°C (300, 400, and 500°C models available upon request), equipped with a liquid nitrogen cooling module.

Vacuum chamber design with protective gas capability

Upper-computer software control

Support for modifying or customizing multi-probe testing

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Custom Temperature Chucks

Custom Temperature Chucks

●High and low-temperature heating chuck in semiconductor testing, ●Conducted on wafers or chips under various thermal conditions. ●-65° ℃ -300° ℃ CDA air cooling, electric cooling ●Temperature uniformity ± 0.5 ℃, ●Maximum withstand voltage 10 KV, ●Maximum withstand current 500A ●Leakage accuracy 300 fA

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CGO-4-N High-Temperature and Low-Temperature Vacuum Probe Station

CGO-4-N High-Temperature and Low-Temperature Vacuum Probe Station

Non-destructive electrical analysis for materials and front-end devices, applied to DC, RF/mmW testing; as well as MEMS and optoelectronic testing, among others.

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Sindongbao

19874522745

miles@cindbest.com

Unit A, 1st Floor, Building 2, Jiayiyuan Digital Science Park, Xinshi Community, Dalang Subdistrict, Longhua District, Shenzhen City

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