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Probe station
Cindbest high-power device characterization system is specifically designed for testing high-power devices directly on wafers.
The Cindbest probe station systems offer complete solutions for both 150 mm and 200 mm wafers.
They are designed to enable low-contact-resistance measurements of power semiconductors across a wide temperature range.
M001 Compact Vacuum High- and Low-Temperature Probe Station
M002 Vacuum High- and Low-Temperature Probe Station
4-probe, manual positioning, standard match1.5-meter coaxial test cable (coaxial male connector)
Temperature range: -196 to 200°C (300, 400, and 500°C models available upon request), equipped with a liquid nitrogen cooling module.
Vacuum chamber design with protective gas capability
Upper-computer software control
Support for modifying or customizing multi-probe testing
CGO-4-N High-Temperature and Low-Temperature Vacuum Probe Station
PCB RF/Impedance testing Probe Station Series
Supported maximum PCB size: 800mm x 700mm
Thickness: 0.2–10 mm (large size, thin)
Platform dimensions: Length × Width × Height (130cm × 110cm × 150cm)
Sample stage fixing method: PCB fixture (4 sets)
Microscope stage fine adjustment travel: 50 x 50 mm Coarse adjustment travel: 800 x 700 mm
The probe holder platform can accommodate up to 4 probe holders or 2 spread-spectrum modules, with an adjustable range of 800 x 700.
Mobile needle holder platform, allowing flexible placement of the needle holder at any desired location. Magnetic reverse adsorption makes it suitable for industries such as: (TFT-LCD, STN-LCD, OLED, semiconductor, optoelectronics plants) or PCB manufacturing facilities.
Integrated air-floating vibration-isolation design, with natural frequencies of 1.5 Hz (horizontal) and 2 Hz (vertical). The stand features casters and includes an air compressor.
Net support frame dimensions: Length * Width * Height (1210mm * 704mm * 1600mm) – for reference only; subject to the actual product.